評價(jia)內存條的性能指標(biao)一共有四個:
(1) 存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)容(rong)(rong)量:即(ji)一根內(nei)存(cun)(cun)(cun)(cun)條可(ke)(ke)以(yi)容(rong)(rong)納(na)的(de)(de)(de)二進(jin)制信息量,如常用的(de)(de)(de)168線內(nei)存(cun)(cun)(cun)(cun)條的(de)(de)(de)存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)容(rong)(rong)量一般多為(wei)(wei)32兆、64兆和128兆。而DDRII3普(pu)遍(bian)為(wei)(wei)1GB到(dao)8GB。 (2) 存(cun)(cun)(cun)(cun)取速度(存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)周(zhou)期):即(ji)兩(liang)次獨立的(de)(de)(de)存(cun)(cun)(cun)(cun)取操(cao)作(zuo)之間(jian)(jian)(jian)(jian)所需的(de)(de)(de)最短時(shi)間(jian)(jian)(jian)(jian),又稱為(wei)(wei)存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)周(zhou)期,半導體存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)器(qi)的(de)(de)(de)存(cun)(cun)(cun)(cun)取周(zhou)期一般為(wei)(wei)60納(na)秒至100納(na)秒。 (3) 存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)器(qi)的(de)(de)(de)可(ke)(ke)靠性(xing)(xing)(xing):存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)器(qi)的(de)(de)(de)可(ke)(ke)靠性(xing)(xing)(xing)用平(ping)均故障(zhang)間(jian)(jian)(jian)(jian)隔時(shi)間(jian)(jian)(jian)(jian)來衡量,可(ke)(ke)以(yi)理解為(wei)(wei)兩(liang)次故障(zhang)之間(jian)(jian)(jian)(jian)的(de)(de)(de)平(ping)均時(shi)間(jian)(jian)(jian)(jian)間(jian)(jian)(jian)(jian)隔。 (4)性(xing)(xing)(xing)能(neng)價(jia)格比(bi):性(xing)(xing)(xing)能(neng)主要包(bao)括存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)器(qi)容(rong)(rong)量、存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)周(zhou)期和可(ke)(ke)靠性(xing)(xing)(xing)三項內(nei)容(rong)(rong),性(xing)(xing)(xing)能(neng)價(jia)格比(bi)是一個綜(zong)合性(xing)(xing)(xing)指標,對于不(bu)同(tong)的(de)(de)(de)存(cun)(cun)(cun)(cun)儲(chu)(chu)(chu)器(qi)有不(bu)同(tong)的(de)(de)(de)要求。